Publications

2019

  • S. Dilger, M. Trottmann, and S. Pokrant, Cover Feature: Scaling Up Electrodes for Photoelectrochemical Water Splitting: Fabrication Process and Performance of 40 cm2 LaTiO2N Photoanodes (ChemSusChem 9/2019). ChemSusChem, 2019. 12 1768-1768.
  • S. Dilger, M. Trottmann, and S. Pokrant, Scaling Up Electrodes for Photoelectrochemical Water Splitting: Fabrication Process and Performance of 40 cm(2) LaTiO2 N Photoanodes. ChemSusChem, 2019. 12 1931-1938.

2018

  • S. Suter, M. Cantoni, Y.K. Gaudy, S. Pokrant, and S. Haussener Linking morphology and multi- physical transport in structured photoelectrodes. Sustainable Energy & Fuels, 2018. DOI: 10.1039/C8SE00215K.
  • Y.K. Gaudy, S. Dilger, S. Landsmann, U. Aschauer, S. Pokrant, and S. Haussener, Determination and optimization of material parameters of particle-based LaTiO2N photoelectrodes. Journal of Materials Chemistry A, 2018. 6 17337-17352. 

2017

  • S. Pokrant, S. Dilger, S. Landsmann, and M. Trottmann, Size effects of cocatalysts in photoelectrochemical and photocatalytic water splitting. Materials Today Energy, 2017. 5 158-163. 

2016

  • S. Pokrant, S. Dilger, and S. Landsmann, Morphology and mesopores in photoelectrochemically active LaTiO2N single crystals. Journal of Materials Research, 2016. 31 1574-1579.
  • S. Landsmann, Y. Surace, M. Trottmann, S. Dilger, A. Weidenkaff, and S. Pokrant, Controlled Design of Functional Nano-Coatings: Reduction of Loss Mechanisms in Photoelectrochemical Water Splitting. Acs Applied Materials & Interfaces, 2016. 8 12149-12157.
  • Y. Surace, M. Simoes, S. Pokrant, and A. Weidenkaff, Capacity fading in Li3MnO4: A post- mortem analysis. Journal of Electroanalytical Chemistry, 2016. 766 44-51.
  • H. Hagemann, D. Lovy, S. Yoon, S. Pokrant, N. Gartmann, B. Walfort, and J. Bierwagen, Wavelength dependent loading of traps in the persistent phosphor SrAl2O4:Eu2+, Dy3+. Journal of Luminescence, 2016. 170 299-304.
  • S. Dilger, S. Landsmann, M. Trottmann, and S. Pokrant, Carbon containing conductive networks in composite particle-based photoanodes for solar water splitting. J. Mater. Chem. A, 2016. 4 17087-17095. 

2015

  • S. Yoon, J. Bierwagen, M. Trottmann, B. Walfort, N. Gartmann, A. Weidenkaff, H. Hagemann, and S. Pokrant, The influence of boric acid on improved persistent luminescence and thermal oxidation resistance of SrAl2O4:Eu2+. Journal of Luminescence, 2015. 167 126-131.
  • A. Kambolis, D. Ferri, Y. Lu, S.N. Yannopoulos, S. Pokrant, D. Rentsch, and O. Krocher, Structural Modification of Ni/gamma-Al2O3 with Boron for Enhanced Carbon Resistance during CO Methanation. Chemcatchem, 2015. 7 3261-3265.
  • S. Landsmann, A.E. Maegli, M. Trottmann, C. Battaglia, A. Weidenkaff, and S. Pokrant, Design Guidelines for High-Performance Particle-Based Photoanodes for Water Splitting: Lanthanum Titanium Oxynitride as a Model. Chemsuschem, 2015. 8 3451-3458.
  • M. Simoes, Y. Surace, S. Yoon, C. Battaglia, S. Pokrant, and A. Weidenkaff, Hydrothermal vanadium manganese oxides: Anode and cathode materials for lithium-ion batteries. Journal of Power Sources, 2015. 291 66-74.
  • Y. Surace, M. Simoes, L. Karvonen, S. Yoon, S. Pokrant, and A. Weidenkaff, Freeze drying synthesis of Li3MnO4 cathode material for Li-ion batteries: A physico-electrochemical study. Journal of Alloys and Compounds, 2015. 644 297-303. 

2014  

  • Y. Surace, M. Simoes, J. Eilertsen, L. Karvonen, S. Pokrant, and A. Weidenkaff, Functionalization of Ca2MnO4-delta by controlled calcium extraction: Activation for electrochemical Li intercalation. Solid State Ionics, 2014. 266 36-43.
  • S.H. Yoon, E.H. Otal, A.E. Maegli, L. Karvonen, S.K. Matam, S.G. Ebbinghaus, B. Walfort, H. Hagemann, S. Pokrant, and A. Weidenkaff, Improved persistent luminescence of CaTiO3:Pr by fluorine substitution and thermochemical treatment. Journal of Alloys and Compounds, 2014. 613 338-343.
  • S. Pokrant, M.C. Cheynet, S. Irsen, A.E. Maegli, and R. Erni, Mesoporosity in Photocatalytically Active Oxynitride Single Crystals. Journal of Physical Chemistry C, 2014. 118 20940-20947.
  • A.E. Maegli, S. Pokrant, T. Hisatomi, M. Trottmann, K. Domen, and A. Weidenkaff, Enhancement of Photocatalytic Water Oxidation by the Morphological Control of LaTiO2N and Cobalt Oxide Catalysts. Journal of Physical Chemistry C, 2014. 118 16344-16351.
  • M. Simoes, Y. Mettan, S. Pokrant, and A. Weidenkaff, Surface-Modified Lithiated H2V3O8: A Stable High Energy Density Cathode Material for Lithium-Ion Batteries with LiPF6 Electrolytes. Journal of Physical Chemistry C, 2014. 118 14169-14176.
  • S. Yoon, A.E. Maegli, L. Karvonen, A. Shkabko, S. Populoh, K. Galazka, L. Sagarna, M.H. Aguirre, P. Jakes, R.A. Eichel, S.G. Ebbinghaus, S. Pokrant, and A. Weidenkaff, Synthesis, Crystal Structure, Electric and Magnetic Properties of LaVO2.78N0.10. Zeitschrift Fur Anorganische Und Allgemeine Chemie, 2014. 640 797-804.
  • M. Simoes, L. Karvonen, A. Maegli, S. Yoon, S. Pokrant, A. Weidenkaff, and Y. Mettan, Structure stability of LixHyV3O8 exposed to water-vapour. International Journal of Nanotechnology, 2014. 11 932-945. 

2013

  • S. Yoon, A.E. Maegli, L. Karvonen, S.K. Matam, A. Shkabko, S. Riegg, T. Grossmann, S.G. Ebbinghaus, S. Pokrant, and A. Weidenkaff, Bandgap tuning in SrTi(N,O,F)(3) by anionic- lattice variation. Journal of Solid State Chemistry, 2013. 206 226-232.
  • S.S. Scherrer, M. Cattani-Lorente, S. Yoon, L. Karvonen, S. Pokrant, F. Rothbrust, and J. Kuebler, Post-hot isostatic pressing: A healing treatment for process related defects and laboratory grinding damage of dental zirconia? Dental Materials, 2013. 29 E180-E190.
  • L. Sagarna, K.Z. Rushchanskii, A. Maegli, S. Yoon, S. Populoh, A. Shkabko, S. Pokrant, M. Lezaic, R. Waser, and A. Weidenkaff, Structure and thermoelectric properties of EuTi(O,N)(3 +/-delta). Journal of Applied Physics, 2013. 114.
  • S. Yoon, E.H. Otal, A.E. Maegli, L. Karvonen, S.K. Matam, S. Riegg, S.G. Ebbinghaus, J.C. Fallas, H. Hagemann, B. Walfort, S. Pokrant, and A. Weidenkaff, Improved photoluminescence and afterglow of CaTiO3:Pr3+ by ammonia treatment. Optical Materials Express, 2013. 3 248-259.
  • S. Pokrant, A.E. Maegli, G.L. Chiarello, and A. Weidenkaff, Perovskite-related Oxynitrides in Photocatalysis. Chimia, 2013. 67 162-167.
  • S. Yoon, A.E. Maegli, S.K. Matam, M. Trottmann, T. Hisatomi, C.M. Leroy, M. Gratzel, S. Pokrant, and A. Weidenkaff, The Influence of the Ammonolysis Temperature on the Photocatalytic Activity of beta-TaON. International Journal of Photoenergy, 2013. 

2012

  • N. Vogel-Schauble, Y.E. Romanyuk, S. Yoon, K.J. Saji, S. Populoh, S. Pokrant, M.H. Aguirre, and A. Weidenkaff, Thermoelectric properties of nanostructured Al-substituted ZnO thin films. Thin Solid Films, 2012. 520 6869-6875.
  • A.E. Maegli, T. Hisatomi, E.H. Otal, S. Yoon, S. Pokrant, M. Gratzel, and A. Weidenkaff, Structural and photocatalytic properties of perovskite-type (La,Ca)Ti(O,N)(3) prepared from A- site deficient precursors. Journal of Materials Chemistry, 2012. 22 17906-17913. 

2010

  • M. Cheynet, S. Pokrant, S. Irsen, and P. Kruger, New fine structures resolved at the ELNES Ti-L- 2,L-3 edge spectra of anatase and rutile: Comparison between experiment and calculation. Ultramicroscopy, 2010. 110 1046-1053. 

2009

  • A.P. Merkle, S. Pokrant, and S. Irsen, Low-Loss Energy-Filtered Transmission Electron Microscopy for Imaging and Analysis of Nanoparticles. Microscopy and Microanalysis, 2009. 15 490-491. 

2007

  • M.C. Cheynet, S. Pokrant, F.D. Tichelaar, and J.L. Rouviere, Crystal structure and band gap determination of HfO2 thin films. Journal of Applied Physics, 2007. 101. 

2006

  • S. Pokrant, R. Pantel, and M. Cheynet, Physical characterization by valence electron energy loss spectroscopy. Microelectronic Engineering, 2006. 83 2364-2367.
  • M. Muller, A. Mondot, D. Aime, B. Froment, A. Talbot, J.M. Roux, G. Ribes, Y. Morand, S. Descombes, P. Gouraud, F. Leverd, S. Pokrant, A. Toffoli, and T. Skotnicki, A new CMP-less integration approach for highly scaled totally silicided (TOSI) gate bulk transistors based on the use of selective S/D Si epitaxy and ultra-low gates. Solid-State Electronics, 2006. 50 620- 625.
  • A. Mondot, M. Muller, A. Talbot, C. Vizioz, S. Pokrant, F. Leverd, F. Martin, C. Leroux, Y. Morand, S. Descombes, D. Aime, F. Allain, P. Besson, and T. Skotnicki, Dual phase TOSI-gate process on High-K dielectrics in a CMP-less flow, in ESSDERC 2006: Proceedings of the 36th European Solid-State Device Research Conference, A.M. Ionescu, M. Declercq, and Y. Leblebici, Editors. 2006. 117-120.
  • C. Fenouillet-Beranger, C. Gallon, A. Vandooren, D. Aime, L. Tosti, F. Leverd, O. Faynot, C. Arvet, C. Perrot, B. Froment, M. Muller, F. Allain, A. Toffoli, S. Vanbergue, M.L. Villani, D. Delille, S. Pokrant, and T. Skotnicki, First ultra-thin film FDSOI devices with CMP-less TOtally SIlicided (TOSI) gate Integration, in ESSDERC 2006: Proceedings of the 36th European Solid- State Device Research Conference, A.M. Ionescu, M. Declercq, and Y. Leblebici, Editors. 2006. 158-161.
  • N. Bicais-Lepinay, F. Andre, S. Brevers, P. Guyader, C. Trouiller, L.F.T. Kwakman, S. Pokrant, D. Verkleij, R. Schampers, L. Ithier, E. Sicurani, and C. Wyon, In-line TEM sample preparation and wafer return strategy for rapid yield learning - art. no. 615217, in Metrology, Inspection, and Process Control for Microlithography XX, Pts 1 and 2, C.N. Archie, Editor. 2006. 15217-15217.  

2005

  • S. Smith, K. Aouadi, J. Collins, E. van der Vegt, M.T. Basso, M. Juhel, and S. Pokrant, Low resistivity tungsten for contact metallization. Microelectronic Engineering, 2005. 82 261-265.
  • S. Pokrant, M. Cheynet, S. Jullian, and R. Pantel, Chemical analysis of nanometric dielectric layers using spatially resolved VEELS. Ultramicroscopy, 2005. 104 233-243.
  • V. Vachellerie, S. Kremer, A. Elazami, P. Morin, C. Julien, D. Duca, D. Guiheux, N. Bicais, and S. Pokrant, Gate Spacer width monitoring study with Scatterometry based on Spectroscopic Ellipsometry, in Characterization and Metrology for ULSI Technology 2005, D.G. Seiler, et al., Editors. 2005. 411-420.
  • A. Pouydebasque, B. Dumont, F. Wacquant, A. Halimaoui, C. Laviron, D. Lenoble, R. El Farhane, B. Duriez, F. Arnaud, V. Carron, C. Rossato, S. Pokrant, F. Salvetti, A. Dray, F. Boeuf, T. Skotnicki, and S.T.D. Japan Soc Appl Phys, NMOS-junction integration study with ultra-high temperature non-diffusive laser annealing for the 45nm node and below. Fifth International Workshop on Junction Technology. 2005. 11-14.
  • M. Muller, A. Mondot, N. Gierczynski, D. Aime, B. Froment, F. Leverd, P. Gouraud, A. Talbot, S. Descombes, Y. Morand, Y. Le Tiec, P. Besson, A. Toffoli, G. Ribes, J.M. Roux, S. Pokrant, F. Andre, T. Skotnicki, and Ieee, An easily integrable NiSi TOSI-gate/SiON-module for LP SRAM applications based on a single step silicidation of gate and junction. Ieee International Electron Devices Meeting 2005, Technical Digest. 2005. 641-644.
  • A. Pouydebasque, B. Dumont, R. El-Farhane, A. Halimaoui, C. Laviron, D. Lenoble, C. Rossato, N. Casanova, V. Carron, S. Pokrant, and T. Skotnicki, CMOS integration of solid phase epitaxy for sub-50nm devices, in Proceedings of Essderc 2005: 35th European Solid-State Device Research Conference, G. Ghibaudo, et al., Editors. 2005. 419-422.
  • A. Mondot, M. Muller, D. Aime, B. Froment, F. Cacho, A. Talbot, F. Leverd, M. Rivoire, Y. Morand, S. Descombes, P. Besson, A. Toffoli, S. Pokrant, and T. Skotnicki, Silicidation induced strain phenomena in TOtally SIlicided (TOSI) gate transistors, in Proceedings of Essderc 2005: 35th European Solid-State Device Research Conference, G. Ghibaudo, et al., Editors. 2005. 427-430.
  • M. Muller, A. Mondot, D. Aime, B. Froment, A. Talbot, J.M. Roux, G. Ribes, Y. Morand, S. Descombes, P. Gouraud, F. Leverd, S. Pokrant, A. Toffoli, and T. Skotnicki, CMP-less integration of 40nm-gate TOtally SIlicided (TOSI) bulk transistors using selective S/D Si epitaxy and ultra-low gates, in Proceedings of Essderc 2005: 35th European Solid-State Device Research Conference, G. Ghibaudo, et al., Editors. 2005. 453-456. 

2002

  • S. Pokrant, O. Fruchart, C. Meyer, and L. Ortega, Growth of Tb(0001) on Nb and Mo(110) surfaces. Surface Science, 2002. 506 235-242.S. Pokrant, C. Meyer, O. Fruchart, and A. Sulpice, Magnetic properties of Tb (0001) particles on Nb (110). Journal of Magnetism and Magnetic Materials, 2002. 242 568-571. 

2001

  • S. Pokrant and J.A. Becker, Magnetization curves of Dy-N clusters. European Physical Journal D, 2001. 16 165-168.
  • S. Pokrant and J.A. Becker, Magnetic structure of DYN and DYNBiM clusters isolated in a molecular beam. Journal of Magnetism and Magnetic Materials, 2001. 226 1921-1923. 

2000

  • S. Pokrant, Evidence for adiabatic magnetization of cold Dy-N Clusters. Physical Review A, 2000. 62. 

1999

  • S. Pokrant, C. Herwig, T. Hihara, and J.A. Becker, Electronic spin-spin coupling in rare earth doped semiconductor and semimetal clusters. European Physical Journal D, 1999. 9 509-512.S. Pokrant and K.B. Whaley, Tight-binding studies of surface effects on electronic structure of CdSe nanocrystals: the role of organic ligands, surface reconstruction, and inorganic capping shells. European Physical Journal D, 1999. 6 255-267.
  • N.A. Hill, S. Pokrant, and A.J. Hill, Optical properties of Si-Ge semiconductor nano-onions. Journal of Physical Chemistry B, 1999. 103 3156-3161. 

1998

  • T. Hihara, S. Pokrant, and J.A. Becker, Magnetic moments and chemical bonding in isolated BiNCoM clusters. Chemical Physics Letters, 1998. 294 357-362.K. Leung, S. Pokrant, and K.B. Whaley, Exciton fine structure in CdSe nanoclusters. Physical Review B, 1998. 57 12291-12301.
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